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Techniques and Equipment

Techniques and Equipment

EquipmentSpecification and application
MTS XP (KLA Tencor) NanoindenterFor nano- und micromechanical test at room temperature. Available options: CSM, DCM and HL. Max. load = 10N.
Hystron/Bruker TI980 NanoindenterFor nano- und micromechanical tests at room/elevated temperature (up to 600°C), Available options: NanoDMA, MultiRange nanoProbe, xProbe, SPM imaging, XPM, Acoustic emission. Max. load = 3N.
Deben MikrotestFor mikromechanical Ex-situ- and In-situ-SEM tests at room temperature. Available options: tension, compression, 4 point bending, EBSD setup mounts. Max. load = 200N.
ThermoFischer Nanolab 200 Zweistrahlmikroskop (SEM/FIB)For microstructural characterization and milling with Ga. Available detectors/methods: EBSD, EDS, TLD, Omniprobe, Nanomechanics Inc. In-situ nanoindenter.
ThermoFischer Helios G4 UXe PFIB Zweistrahlenmikroskop (SEM/FIB)For microstructural characterization and milling with Plasma. Available detectors/methods: EBSD, EDS, TLD, STEM, BS,
Bruker PI95 TEM picoindenterFor in-situ mechanical testin inside a TEM
KLA NanoFlipFor in-situ mechanical testing inside an SEM

Also there is a direct access to a Talos F200i equipped with EFTEM/EELS, EDX and STEM detectors and the Hysitron/Bruker in situ nanoindenter TI980. Other instruments include SAXS/WAXS and Zeiss Ultra Nanotomography.