The following instruments are available:

STRESS-SPEC

[ Photo: Astrid Eckert / TUM]

for stress, texture, or phase analysis

SANS-1

[Photo: Sebastian Mast]

for studies of the nanostructure of bulk samples

REFSANS

[Photo: Wenzel Schürmann / TUM]

for studies of nanostructures at interfaces

Materials Science Lab

for sample preparation and complementary characterisation

The most important methods:

• Diffraction – strain analysis

For measurements of stresses in the interior of materials and components.

• Diffraction – texture measurements

For measurements of crystallographic textures.

• Diffraction – phase analysis

For the quantitative determination of the phase composition of a material.

• Small-Angle Neutron Scattering (SANS)

For the analysis of nanostructures in the bulk, e.g. precipitates.

• Neutronen-reflectometry and small-angle scattering under grazing incidence (GISANS)

For the analysis of nanostructuires at interfaces, e.g. coatings.