The following instruments are available:
[ Photo: Astrid Eckert / TUM]
for stress, texture, or phase analysis
[Photo: Sebastian Mast]
for studies of the nanostructure of bulk samples
[Photo: Wenzel Schürmann / TUM]
for studies of nanostructures at interfaces
for sample preparation and complementary characterisation
The most important methods:
• Diffraction – strain analysis
For measurements of stresses in the interior of materials and components.
• Diffraction – texture measurements
For measurements of crystallographic textures.
• Diffraction – phase analysis
For the quantitative determination of the phase composition of a material.
• Small-Angle Neutron Scattering (SANS)
For the analysis of nanostructures in the bulk, e.g. precipitates.
• Neutronen-reflectometry and small-angle scattering under grazing incidence (GISANS)
For the analysis of nanostructuires at interfaces, e.g. coatings.