Scanning Electron Microskope (SEM) FEI Quanta 650 FEG
![](/imperia/md/images/hzg/institut_fuer_werkstoffforschung/wmp/fittosize_500_0_d1e6c19914a1ba2966812d2cb770e465_140617_wmp_www_sem_quanta_650_foto_frontal.jpg)
Technical Data
• Acceleration voltage : 200 V to 30 kV
• Control stage: eucentric position
• Analytical systems: simultaneous electron backscatter diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS) spectrometer
• Auxiliary systems: control camera, fast loading
• External systems: 24h emergency power supply, antimagnetic frame, vibration damping table
• Miscellaneous: beam slowing, concentric solid-state backscatter detector (CBS)
Vacuum Modes
• High vacuum, HiVac (10^-2 to10^-4 Pa)
• Low vacuum, LoVac (10 to 200 Pa)
• Extended vacuum mode, ESEM (10 to 4000 Pa)